Wafer Macro Inspection System
![WIND2](http://www.ati2000.co.kr/wordpress/wp-content/uploads/2024/04/WIND2.png)
- Higher Resolution Optics
- Color Macro Inspection
- 4 Objective Lenses
- NAC(Numerical Aperture Controller
- Backside Inspection with IR
- Color Backside Inspection
- PBI(Post Bonding Inspection)
- Enhanced 3D Optic
- Edge Inspection
- EBR Measurement
- Full Area Inspection on Wafer
![WIND2-1](http://www.ati2000.co.kr/wordpress/wp-content/uploads/2024/04/WIND2-1.png)
![WIND2-2](http://www.ati2000.co.kr/wordpress/wp-content/uploads/2024/04/WIND2-2.png)
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